Induced resonance absorption (INDAB) in thin films: a current example for versatile and efficient use of optical coatings in semi-optical processes

Hubert Pohlack; Erich J. Hacker

doi:10.1117/12.141045

4 March 1993 Induced resonance absorption (INDAB) in thin films: a current example for versatile and efficient use of optical coatings in semi-optical processes

Hubert Pohlack, Erich J. Hacker

Author Affiliations +

Proceedings Volume 1782, Thin Films for Optical Systems; (1993) https://doi.org/10.1117/12.141045
Event: Optical Systems Design '92, 1992, Berlin, Germany

Abstract

Recently the phenomenon of induced resonance absorption (INDAB) in thin films has extended the technological range of applications for optical layers noticeably. The INDAB characteristics, being significant for practical purposes, are at first an extremely high volume density of absorbed radiant energy in thin films: ideally, the total absorption in film thicknesses which are small compared to the penetration depth of radiant energy in the unlimited medium; secondly, a possible control of spatial absorption distribution within the INDAB layer. The INDAB effect is an example of how thin optical coatings exert their important function on today's complex high technology systems. It demonstrates convincingly that thin films affect a wide field of applications, especially by initiating, promoting, or optimizing a multitude of semi-optical processes. (A `semi-optical process' in this context, for instance, means an energy conversion from optical to non-optical and vice versa, especially photothermic, photochemical, and photoelectronic phenomena.) This paper illustrates the basic principle of INDAB, and in giving an example of application demonstrates the innovation ability and the increase in efficiency by use of INDAB.

Citation Download Citation

Hubert Pohlack and Erich J. Hacker "Induced resonance absorption (INDAB) in thin films: a current example for versatile and efficient use of optical coatings in semi-optical processes", Proc. SPIE 1782, Thin Films for Optical Systems, (4 March 1993); https://doi.org/10.1117/12.141045

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available