Paper
22 September 1993 Gaussian filtering of three-dimensional engineering surface topography
N. L. Luo, P. J. Sullivan, Kenneth J. Stout
Author Affiliations +
Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156497
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
The study of surface topography in engineering is of importance for a large number of application areas. A necessary step in the study of the functional significance of surface topography in an application is to identify and separate the functionally significant components of the surface in preparation for subsequent analysis. A filter commonly used in profile filtering is the Gaussian filter that corrects the phase distortion drawbacks of the standardised 2RC filters and is currently considered by an ISO technical committee to replace the 2RC filter as the standard filter for 2-D profile filtering. In this paper we consider the characteristics and suitability of the Gaussian filter for surface filtering in general and present a detailed study of the Gaussian filter for three-dimensional surface topography filtering.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. L. Luo, P. J. Sullivan, and Kenneth J. Stout "Gaussian filtering of three-dimensional engineering surface topography", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156497
Lens.org Logo
CITATIONS
Cited by 8 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Gaussian filters

Linear filtering

Digital filtering

Fourier transforms

Optical filters

3D metrology

Convolution

Back to Top