Baseline metrology system of the U.S. Naval Observatory Astrometric Interferometer

Nicholas M. Elias II

doi:10.1117/12.177284

9 June 1994 Baseline metrology system of the U.S. Naval Observatory Astrometric Interferometer

Nicholas M. Elias II

Proceedings Volume 2200, Amplitude and Intensity Spatial Interferometry II; (1994) https://doi.org/10.1117/12.177284
Event: 1994 Symposium on Astronomical Telescopes and Instrumentation for the 21st Century, 1994, Kailua, Kona, HI, United States

Abstract

The USNO Astrometric Interferometer (USNOAI; the dedicated subarray of the Navy Prototype Optical Interferometer at Lowell Observatory, Flagstaff, AZ) is presently under construction and expected to begin limited operations in the spring of 1993. The main goal of the USNOAI observations is to provide a northern hemisphere catalog of approximately a thousand stars with positions known to a few mas. In order to meet this requirement, a baseline laser metrology system must be employed to measure the 3D motions of the baselines with an accuracy better than approximately equals 0.1 micrometers . The metrology scheme, as presently conceived, represents the largest and most complex high-resolution laser metrology system ever attempted.

Citation Download Citation

Nicholas M. Elias II "Baseline metrology system of the U.S. Naval Observatory Astrometric Interferometer", Proc. SPIE 2200, Amplitude and Intensity Spatial Interferometry II, (9 June 1994); https://doi.org/10.1117/12.177284

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available