Radiation emission characteristics in the x-ray/EUV/FUV from spherically pinched and vacuum spark sources

Jiong Chen; Emilio Panarella; B. Hilko; Haibo Chen

doi:10.1117/12.180021

12 July 1994 Radiation emission characteristics in the x-ray/EUV/FUV from spherically pinched and vacuum spark sources

Jiong Chen, Emilio Panarella, B. Hilko, Haibo Chen

Proceedings Volume 2278, X-Ray and UV Detectors; (1994) https://doi.org/10.1117/12.180021
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

We have developed two sources of high flux radiation: one, designated as SPX II, exploits the principle of spherical convergence of a strong shock wave in a noble gas to generate a plasma at the center of a sphere hot enough to emit broadband radiation from the UV to the soft x-ray region of the spectrum; the other is based on the principle of vacuum spark, whereby accelerated electrons in a strong electric field in vacuum bombard an aluminum anode surface, leading to K-alpha line emission (1.7 keV). Typical measured outputs from the SPX II are: 186 W in the visible range (3500 - 2800 angstrom); 754 W in the UV range (2800 - 1800 angstrom); 650 W in the deep UV (1800 - 600 angstrom), and 5 W in the soft x ray (15 - 10 angstrom) for an operating repetition rate of the machine of 1 Hz. Typical measured output from the vacuum spark source is 30 W in the K-alpha line (7 angstrom) for a few kilowatt machine. The above are all powers measured beyond the pertinent filter used to select the radiation of interest, such as beryllium, aluminum, or other filters.

Citation Download Citation

Jiong Chen, Emilio Panarella, B. Hilko, and Haibo Chen "Radiation emission characteristics in the x-ray/EUV/FUV from spherically pinched and vacuum spark sources", Proc. SPIE 2278, X-Ray and UV Detectors, (12 July 1994); https://doi.org/10.1117/12.180021

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