Detecting and characterizing small voids in mostly diffuse materials

Norman Wittels; Tahar El-Korchi; Yinhong Li; Michael A. Gennert

doi:10.1117/12.198832

6 January 1994 Detecting and characterizing small voids in mostly diffuse materials

Norman Wittels, Tahar El-Korchi, Yinhong Li, Michael A. Gennert

Proceedings Volume 2348, Imaging and Illumination for Metrology and Inspection; (1994) https://doi.org/10.1117/12.198832
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States

Abstract

The design of a high-speed range camera capable of providing on-the-fly range map assessment of printed circuit boards is described. The system uses an HeNe laser and time- space coding to achieve 180,000 range measurements per second. System spatial resolution is 0.001 X 0.001 in., and the range resolution is 0.00066 in., with a working depth of range of 3/8 in. We discuss the electro-optic design and present results from various imaging experiments using the instrument.

Citation Download Citation

Norman Wittels, Tahar El-Korchi, Yinhong Li, and Michael A. Gennert "Detecting and characterizing small voids in mostly diffuse materials", Proc. SPIE 2348, Imaging and Illumination for Metrology and Inspection, (6 January 1994); https://doi.org/10.1117/12.198832

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