10.6 Micron Wavelength Interferometry And The Measurement Of Infrared Transmitting Materials Index Of Refraction Homogeneity

Charles E. Synborski; Mary J. Hanes

doi:10.1117/12.959559

19 November 1980 10.6 Micron Wavelength Interferometry And The Measurement Of Infrared Transmitting Materials Index Of Refraction Homogeneity

Charles E. Synborski, Mary J. Hanes

Author Affiliations +

Proceedings Volume 0255, Practical Electro-Optical Instruments and Techniques; (1980) https://doi.org/10.1117/12.959559
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States

Abstract

Infrared optical systems, due primarily to military requirements, have made the transition from simple condenser optics which throw "heat" onto a discrete detector to diffraction limited imaging optics which are used to "view" in the infrared or illuminate high spatial resolution focal plane detector systems. Optically polished infrared lens element surfaces can be checked for sphericity and radius of curvature using conventional laser interferometry. However, the characterization of infrared material index of refraction homogeneity has been overlooked. To meet these newly emerging problems head on, Tropel developed TIRIS, the Tropel Infrared Interferometer System. The goal of this paper is to illustrate the importance of index inhomogeneity measurements by citing the degradation in performance (wavefront and Optical Transfer Function) of optical systems, caused by material inhomogeneities. A far infrared interferometer will be introduced, its basic construction outlined, and pertinent measurement parameters and formulas defined. Test results are shown of determining index inhomogeneity of two infrared transmitting samples.

Citation Download Citation

Charles E. Synborski and Mary J. Hanes "10.6 Micron Wavelength Interferometry And The Measurement Of Infrared Transmitting Materials Index Of Refraction Homogeneity", Proc. SPIE 0255, Practical Electro-Optical Instruments and Techniques, (19 November 1980); https://doi.org/10.1117/12.959559

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available