Microcharacterization of semiconductor laser diodes: materials and devices

Abram Jakubowicz

doi:10.1117/12.238185

8 April 1996 Microcharacterization of semiconductor laser diodes: materials and devices

Abram Jakubowicz

Proceedings Volume 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications; (1996) https://doi.org/10.1117/12.238185
Event: Metal/Nonmetal Microsystems: Physics, Technology, and Applications, 1995, Polanica Zdroj, Poland

Abstract

This paper illustrates the application of microscopy techniques to investigate various material processing and device-related problems that one encounters in the development of semiconductor laser diodes. General comments are made concerning local characterization of semiconductors. Various laser reliability/degradation issues are addressed. As an example of how microscopy techniques facilitate the building of modern lasers, the application of the ordering phenomenon is discussed.

Citation Download Citation

Abram Jakubowicz "Microcharacterization of semiconductor laser diodes: materials and devices", Proc. SPIE 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications, (8 April 1996); https://doi.org/10.1117/12.238185

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