Paper
30 September 1996 Simulated calculation of temperature rise in silicon material irradiated by high-power laser
Zhonghua Shen, Jian Lu, Xiao-Wu Ni
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Abstract
Considering the variety of thermal properties of silicon material and the spatial profile of incident laser, the temperature rise in silicon material has been obtained by using a 2D model of heat conduction, the relation between the time needed for the surface to reach melting point and the power density of the incident laser has also been given out and the results have been compared with those obtained by using a 1D model.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhonghua Shen, Jian Lu, and Xiao-Wu Ni "Simulated calculation of temperature rise in silicon material irradiated by high-power laser", Proc. SPIE 2888, Laser Processing of Materials and Industrial Applications, (30 September 1996); https://doi.org/10.1117/12.253130
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Cited by 1 scholarly publication.
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KEYWORDS
Semiconductor lasers

Silicon

Sensors

Thermal modeling

Optical simulations

High power lasers

Electro optical modeling

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