High-resolution phase contrast microscopy with a hard x-ray waveguide

Alessia Cedola; Peter Cloetens; Silvia Di Fonzo; Werner H. Jark; Stefano Lagomarsino; G. Soullie; Christian Riekel

doi:10.1117/12.279388

1 November 1997 High-resolution phase contrast microscopy with a hard x-ray waveguide

Alessia Cedola, Peter Cloetens, Silvia Di Fonzo, Werner H. Jark, Stefano Lagomarsino, G. Soullie, Christian Riekel

Proceedings Volume 3154, Coherent Electron-Beam X-Ray Sources: Techniques and Applications; (1997) https://doi.org/10.1117/12.279388
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

High energy x-ray phase contrast experiment with an unprecedent resolution is shown. The coherent and divergent submicron beam from an x-ray waveguide is used to realize a lensless microscope and to magnify spatial variations in optical path length 500 times or more. The defocused image of a nylon fiber with a resolution of 0.14 micron is presented. Exposure times as short as 0.1 seconds gave already visible contrast, opening the way to high resolution, real time studies.

Citation Download Citation

Alessia Cedola, Peter Cloetens, Silvia Di Fonzo, Werner H. Jark, Stefano Lagomarsino, G. Soullie, and Christian Riekel "High-resolution phase contrast microscopy with a hard x-ray waveguide", Proc. SPIE 3154, Coherent Electron-Beam X-Ray Sources: Techniques and Applications, (1 November 1997); https://doi.org/10.1117/12.279388

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