Analysis of the AXAF HRMA+ACIS effective area measurements from the XRCF

Christopher L. Allen; Paul P. Plucinsky; Brian R. McNamara; Richard J. Edgar; Norbert S. Schulz; Jonathan W. Woo

doi:10.1117/12.331237

19 November 1998 Analysis of the AXAF HRMA+ACIS effective area measurements from the XRCF

Christopher L. Allen, Paul P. Plucinsky, Brian R. McNamara, Richard J. Edgar, Norbert S. Schulz, Jonathan W. Woo

Proceedings Volume 3444, X-Ray Optics, Instruments, and Missions; (1998) https://doi.org/10.1117/12.331237
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We describe the analysis of effective area measurements for the AXAF High Resolution Mirror Assembly (HRMA) and the AXAF CCD Imaging Spectrometer (ACIS). The measurements were obtained at the X-ray Calibration Facility (XRCF) in Huntsville, AL, during April 1997. Measurements obtained with two frontside-illuminated (FI) charge-coupled devices (CCDs) in the imaging array and the backside-illuminated (BI) CCD located on-axis in the spectroscopic array are considered. We compare the XRCF effective area measurements to independent, semi-empirical model predictions constructed using the product of the efficiencies of the AXAF components. The XRCF measurements, in general, confirm the reliability of the model at most energies, but only after correcting the data for several effects related to event pileup. However, after applying the corrections, the uncertainties in the XRCF measurements remain uncomfortably large. We suggest several future avenues of investigation that should improve our knowledge of the HRMA + ACIS effective area.

Citation Download Citation

Christopher L. Allen, Paul P. Plucinsky, Brian R. McNamara, Richard J. Edgar, Norbert S. Schulz, and Jonathan W. Woo "Analysis of the AXAF HRMA+ACIS effective area measurements from the XRCF", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331237

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