Electro-optic holography method for determination of surface shape and deformation

Cosme Furlong; Ryszard J. Pryputniewicz

doi:10.1117/12.312969

30 June 1998 Electro-optic holography method for determination of surface shape and deformation

Proceedings Volume 3478, Laser Interferometry IX: Techniques and Analysis; (1998) https://doi.org/10.1117/12.312969
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Current demanding engineering analysis and design applications require effective experimental methodologies for characterization of surface shape and deformation. Such characterization is of primary importance in many applications, because these quantities are related to the functionality, performance, and integrity of the objects of interest, especially in view of advances relating to concurrent engineering. In this paper, a new approach to characterization of surface shape and deformation using a simple optical setup is described. The approach consists of a fiber optic based electro-optic holography (EOH) system based on an IR, temperature tuned laser diode, a single mode fiber optic directional coupler assembly, and a video processing computer. The EOH can be arranged in multiple configurations which include, the three-camera, three- illumination, and speckle correlation modes.In particular, the three-camera mode is described, as well as a brief description of the procedures for obtaining quantitative 3D shape and deformation information. A representative application of the three-camera EOH system demonstrates the viability of the approach as an effective engineering tool. A particular feature of this system and the procedure described in this paper is that the 3D quantitative data are written to data files which can be readily interfaced to commercial CAD/CAM environments.

Citation Download Citation

Cosme Furlong and Ryszard J. Pryputniewicz "Electro-optic holography method for determination of surface shape and deformation", Proc. SPIE 3478, Laser Interferometry IX: Techniques and Analysis, (30 June 1998); https://doi.org/10.1117/12.312969

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available