Influence of optical light on the charge transfer efficiency of the XMM EPIC pn-CCD camera

Josef Pal; Markus Kuster; Eckhard Kendziorra; Norbert Krause

doi:10.1117/12.366549

22 October 1999 Influence of optical light on the charge transfer efficiency of the XMM EPIC pn-CCD camera

Josef Pal, Markus Kuster, Eckhard Kendziorra, Norbert Krause

Proceedings Volume 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X; (1999) https://doi.org/10.1117/12.366549
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

The European X-ray satellite XMM will be launched in December 1999. One of the focal plane instruments of the European Photon Imaging Camera (EPIC) on board XMM is equipped with a monolithic pn-CCD consisting of 12 individual CCDs with 200 X 64 pixels each. In order to exploit the god intrinsic energy resolution of the pn-CCD, the charge transfer efficiency (CTE) must be well known. Impurities in the wafer material act as traps for electrons, thus removing a fraction of the signal charge at each transfer step towards the readout anode. Electronics generated by optical light from the observed source or other optical sources may well saturate those traps, which results in a different CTE for x-ray generated charge packets. Using single CCDs of flight type, we have analyzed in our test facility at the Institut fuer Astronomie und Astrophysik der Universitaet Tuebingen, the influence of optical light on the CTE of the pn-CCD. In this paper we describe the result of our investigation of the CTE at different x-ray energies and varying optical light intensities.

Citation Download Citation

Josef Pal, Markus Kuster, Eckhard Kendziorra, and Norbert Krause "Influence of optical light on the charge transfer efficiency of the XMM EPIC pn-CCD camera", Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); https://doi.org/10.1117/12.366549

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