Physical model of the charge transfer loss of the pn-CCD camera

Norbert Krause; Ulrich G. Briel; Konrad Dennerl; Heike Soltau; Lothar Strueder; V. E. Zavlin

doi:10.1117/12.366504

22 October 1999 Physical model of the charge transfer loss of the pn-CCD camera

Norbert Krause, Ulrich G. Briel, Konrad Dennerl, Heike Soltau, Lothar Strueder, V. E. Zavlin

Proceedings Volume 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X; (1999) https://doi.org/10.1117/12.366504
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

A single-photon counting x-ray camera based on a fully depleted pn-CCD was developed by the Max-Planck-Institut fuer extraterrestrische Physik. It will be used on the european x-ray satellite XMM as one out of three focal plane detectors. The radiation hard device exhibits an intrinsic charge transfer loss due to titanium deep level trap contamination in the starting material. In order to realize the high spectral resolution of the device, the effects of charge transfer loss have to be corrected. The loss is a function of temperature, signal charge, clocking and the individual transfer history of a transfer channel. A model based on the capture and emission process of electron is in deep level traps has been developed and is applied to the charge transfer loss of the MPE pn-CCD x-ray camera. Each signal is corrected individually. The electron distribution within the potential well and the timing scheme is taken into account. The effect of charge generation due to thermally generated current and residual light proves to be an important parameter of the model. The model is in god agreement with the calibration data of the camera.

Citation Download Citation

Norbert Krause, Ulrich G. Briel, Konrad Dennerl, Heike Soltau, Lothar Strueder, and V. E. Zavlin "Physical model of the charge transfer loss of the pn-CCD camera", Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); https://doi.org/10.1117/12.366504

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