Optical engineering and characterization of the internal electric field of CdZnTe radiation detectors

H. Walter Yao; Ralph B. James; Jay Chris Erickson

doi:10.1117/12.366598

19 October 1999 Optical engineering and characterization of the internal electric field of CdZnTe radiation detectors

H. Walter Yao, Ralph B. James, Jay Chris Erickson

Proceedings Volume 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics; (1999) https://doi.org/10.1117/12.366598
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

A new method of engineering the internal electric field of CdZnTe (CZT) radiation detectors will be introduced. The internal electric field distribution within a CZT detector is engineered via an IR beam with a special photon energy and characterized by a separate polarized optical transmission profile beam utilizing the Pockels electro- optic effect. A theoretical model and calculation will be presented to understand the internal electric field engineering we have performed in our work. 2D images reflecting the internal electrical field intensity changes will be shown and the application of this field engineering method to improve the radiation detectors will be discussed.

Citation Download Citation

H. Walter Yao, Ralph B. James, and Jay Chris Erickson "Optical engineering and characterization of the internal electric field of CdZnTe radiation detectors", Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); https://doi.org/10.1117/12.366598

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