PROCEEDINGS VOLUME 3836
PHOTONICS EAST '99 | 19-22 SEPTEMBER 1999
Machine Vision Systems for Inspection and Metrology VIII
Editor(s): John W. V. Miller, Susan Snell Solomon, Bruce G. Batchelor
Editor Affiliations +
PHOTONICS EAST '99
19-22 September 1999
Boston, MA, United States
Image Processing Algorithms
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360258
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360267
Robert R. Goldberg, Michael R. Goldberg
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360277
Robert R. Goldberg, Jonathan Robinson
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360280
David Kerr, Jonathan T. Wakenshaw
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360281
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360282
Leonid I. Timchenko, Yuri F. Kutaev, Alexander A. Gertsiy, Lubov V. Zahoruiko, Yaroslav O. Galchenko, Tamer Mansur
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360283
Systems Integration and Applications I
Jian Wang, Yufeng Liang, Joseph Wilder
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360259
Yufeng Liang, Joseph Wilder
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360260
Hesong Leng, Joseph Wilder
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360261
Wei Lin, Manpreet Kaur, Marilyn Tremaine, George Hung, Joseph Wilder
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360262
Denise Choffel
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360263
Bruce G. Batchelor, Michael W. Daley, R. J. Mitchell, G. J. Hunter, G. E. Jones, George Karantalis
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360264
High-Speed Architectures (Software Implementations)
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360265
Dominik Rohrmus
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360266
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360268
John W. V. Miller, Spencer D. Luster, Kiana Whitehead
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360269
Young Jun Roh, Kuk Won Ko, Hyungsuck Cho, Hyung Cheol Kim, Hyonam Joo, Sung Kwon Kim
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360270
Yan Li, Lin Wu, Ming Dai, Shanben Chen
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360271
Peter L. Volegov, Vladimir A. Podgornov
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360272
Systems Integration and Applications II
Joseph A. Sgro, Paul C. Stanton
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360273
Jaroslaw P. Sacha, Spencer D. Luster, Behrouz N. Shabestari, John W. V. Miller, Murat Sena
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360274
Timothy E. Smith, Douglas F. Britton, Wayne D. Daley, Richard Carey
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360275
Wayne D. Daley, Sergio Grullon, Douglas F. Britton
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360276
Jose M. Sebastian y Zuniga, David Garcia, Francisco M. Sanchez Moreno, J. M. Gonzalez
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360278
Filiberto Pla, Jose S. Sanchez, Jose M. Sanchiz
Proceedings Volume Machine Vision Systems for Inspection and Metrology VIII, (1999) https://doi.org/10.1117/12.360279
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