Paper
30 December 1999 CD performance of a new high-resolution laser pattern generator
Per Liden, Tomas Vikholm, Lars Kjellberg, Mans Bjuggren, Klas A. Edgren, John-Oscar Larson, Steven Haddleton, Per Askebjer
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Abstract
CD uniformity is one of the most critical parameters for mask making today. The mask error factor (MEF) in lithography for features that are smaller than the stepper wavelength means that any CD error is transferred to the wafer to a greater extent than the stepper reduction factor would indicate. CD results form a new laser pattern generator, the Omega6000 product line, will be presented. The system features an acousto-optic deflection architecture specifically designed to meet the CD requirements of 180 nm photomasks. A 0.86 NA final lens provides the high resolution of the system. The CD control and the high resolution makes the system well suited for today's advanced photomasks.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Per Liden, Tomas Vikholm, Lars Kjellberg, Mans Bjuggren, Klas A. Edgren, John-Oscar Larson, Steven Haddleton, and Per Askebjer "CD performance of a new high-resolution laser pattern generator", Proc. SPIE 3873, 19th Annual Symposium on Photomask Technology, (30 December 1999); https://doi.org/10.1117/12.373335
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Calibration

Photomasks

Bragg cells

Critical dimension metrology

Signal detection

Acousto-optics

Image quality

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