Paper
12 November 1999 Influence of pulse reversal on the characteristics of CdSe films
K. R. Murali, V. Swaminathan
Author Affiliations +
Proceedings Volume 3896, Design, Fabrication, and Characterization of Photonic Devices; (1999) https://doi.org/10.1117/12.370376
Event: International Symposium on Photonics and Applications, 1999, Singapore, Singapore
Abstract
This paper embodies the first report on the pulse reversal deposition of CdSe thin films. The as-deposited and heat treated films were characterized by XRD, optical absorption spectroscopy and electrical properties. The polycrystalline deposits of CdSe obtained indicated a hexagonal structure after heat treatment at 550°C. From the otpical absorption studies the bandgap was found to be 1.70 eV and absorption co-efficient of 104 cm-1 were obtained. At an illumination of 80 mWcm-2 conversion efficiencies of 5.56% and 6.74% were obtained for the photoelectrodes without and with pulse reversal.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. R. Murali and V. Swaminathan "Influence of pulse reversal on the characteristics of CdSe films", Proc. SPIE 3896, Design, Fabrication, and Characterization of Photonic Devices, (12 November 1999); https://doi.org/10.1117/12.370376
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KEYWORDS
Electrodes

Absorption

Heat treatments

Thin films

Quantum efficiency

Absorption spectroscopy

Thin film deposition

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