Atomic force microscopy observations of domains in fine-grain PZT ceramics

Zuoyi Wang; Qing Jiang; John E. Blendell; Grady S. White

doi:10.1117/12.388790

19 June 2000 Atomic force microscopy observations of domains in fine-grain PZT ceramics

Zuoyi Wang, Qing Jiang, John E. Blendell, Grady S. White

Proceedings Volume 3984, Smart Structures and Materials 2000: Mathematics and Control in Smart Structures; (2000) https://doi.org/10.1117/12.388790
Event: SPIE's 7th Annual International Symposium on Smart Structures and Materials, 2000, Newport Beach, CA, United States

Abstract

This study demonstrates that AFM is capable of observing domains of several tens of nanometers in fine grain PZT ceramics. The investigators have also shown that carefully conducted light polishing can result in no significant disturbance to domain patterns in hard PZT ceramics.

Citation Download Citation

Zuoyi Wang, Qing Jiang, John E. Blendell, and Grady S. White "Atomic force microscopy observations of domains in fine-grain PZT ceramics", Proc. SPIE 3984, Smart Structures and Materials 2000: Mathematics and Control in Smart Structures, (19 June 2000); https://doi.org/10.1117/12.388790

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available