Spectrophotometric And Ellipsometric Study Of Leached Layers Formed On Optical Glass By A Diffusion Process

E. Casparis-Hauser; K. H. Guenther; K. Tiefenthaler

doi:10.1117/12.935521

28 November 1983 Spectrophotometric And Ellipsometric Study Of Leached Layers Formed On Optical Glass By A Diffusion Process

E. Casparis-Hauser, K. H. Guenther, K. Tiefenthaler

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Proceedings Volume 0401, Thin Film Technologies I; (1983) https://doi.org/10.1117/12.935521
Event: 1983 International Technical Conference/Europe, 1983, Geneva, Switzerland

Abstract

The formation of leached layers on optical glass BaK 4 by immersion in an acidic solution has been studied both by spectrophotometric and ellipsometric reflectance measurements after various immersion periods. From preliminary spectral reflectance measurements as well as from additional Auger depth profiling results, it can be assumed that the composition and refractive index of the leached layer are homogeneous. However, from physicochemical consi-derations of the diffusion process, a very thin transition layer between the homogeneously leached layer and the bulk glass should exist, and this was not found by these methods. Hence, ellipsometric measurements of various leached layer samples were taken. In a first approximation, the homogeneous layer model holds also for the interpretation of the ellipsometric data. However, the addition of a thin transition layer to the homogeneous leached layer enables better interpretation of the ellipsometric results.

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E. Casparis-Hauser, K. H. Guenther, and K. Tiefenthaler "Spectrophotometric And Ellipsometric Study Of Leached Layers Formed On Optical Glass By A Diffusion Process", Proc. SPIE 0401, Thin Film Technologies I, (28 November 1983); https://doi.org/10.1117/12.935521

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KEYWORDS

Glasses

Reflectivity

Refractive index

Polarizers

Diffusion

Ellipsometry

Profiling

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