Paper
29 December 1999 Photorefractive crystals for efficient linear sensing of speckle-pattern displacements
Erik Raita, Alexei A. Kamshilin, Kimmo Paivasaari, Victor V. Prokofiev, Timo Jaeaeskelaeinen
Author Affiliations +
Proceedings Volume 4016, Photonics, Devices, and Systems; (1999) https://doi.org/10.1117/12.373634
Event: Photonics Prague '99, 1999, Prague, Czech Republic
Abstract
Novel technique for the efficient remote sensing of speckle- pattern displacements is proposed. It is based on the polarization self-modulation effect recently discovered in photorefractive crystals. The technique provides linear responses on the amplitude of the lateral displacement and high sensitivity which is comparable with the interferometric one. Both sensitivity and dynamic range of measurements can be adjusted varying the average speckle size on the input face of crystal. The simple and inexpensive experimental set-up does not include any reference or read-out beam. Proposed technique can be applied for optical measurements of the transient motion of inspected surface such as object's vibration monitoring.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Erik Raita, Alexei A. Kamshilin, Kimmo Paivasaari, Victor V. Prokofiev, and Timo Jaeaeskelaeinen "Photorefractive crystals for efficient linear sensing of speckle-pattern displacements", Proc. SPIE 4016, Photonics, Devices, and Systems, (29 December 1999); https://doi.org/10.1117/12.373634
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KEYWORDS
Crystals

Modulation

Speckle pattern

Speckle

Polarization

Interferometry

Light scattering

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