Paper
21 February 2001 Pilot investigation of automatic comparison of striation marks with structured light
Zeno J. Geradts, Dennis Zaal, Huub Hardy, Jos Lelieveld, Isaac Keereweer, Jurrien Bijhold
Author Affiliations +
Proceedings Volume 4232, Enabling Technologies for Law Enforcement and Security; (2001) https://doi.org/10.1117/12.417516
Event: Enabling Technologies for Law Enforcement, 2000, Boston, MA, United States
Abstract
We have developed and tested an algorithm that can compare striation marks that are acquired with a standard camera and sidelight as well as 3D-information acquired with structured light.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zeno J. Geradts, Dennis Zaal, Huub Hardy, Jos Lelieveld, Isaac Keereweer, and Jurrien Bijhold "Pilot investigation of automatic comparison of striation marks with structured light", Proc. SPIE 4232, Enabling Technologies for Law Enforcement and Security, (21 February 2001); https://doi.org/10.1117/12.417516
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CITATIONS
Cited by 17 scholarly publications.
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KEYWORDS
Structured light

Databases

Algorithm development

Cameras

Forensic science

Light sources

Silicon

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