A Frequency Domain Description Of Interferogram Analysis

Kenneth H. Womack

doi:10.1117/12.936356

15 November 1983 A Frequency Domain Description Of Interferogram Analysis

Kenneth H. Womack

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Proceedings Volume 0429, Precision Surface Metrology; (1983) https://doi.org/10.1117/12.936356
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

Interferogram analysis is discussed as a sampling problem using the concepts of Fourier analysis. The relative merits of random, raster, and uniform sampling of a wavefront are examined. A relationship between a global least squares fit and interpolation in the spatial domain and transfer functions in the frequency domain is described.

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Kenneth H. Womack "A Frequency Domain Description Of Interferogram Analysis", Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); https://doi.org/10.1117/12.936356

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