Laser raster conditioning of KDP and DKDP crystals using XeCl and Nd:YAG lasers

Michael C. Staggs; Ming Yan; Michael J. Runkel

doi:10.1117/12.425050

12 April 2001 Laser raster conditioning of KDP and DKDP crystals using XeCl and Nd:YAG lasers

Michael C. Staggs, Ming Yan, Michael J. Runkel

Proceedings Volume 4347, Laser-Induced Damage in Optical Materials: 2000; (2001) https://doi.org/10.1117/12.425050
Event: Laser-Induced Damage in Optical Materials: 2000, 2000, Boulder, CO, United States

Abstract

Laser conditioning by raster scanning DKP and DKDP crystals using Nd:YAG and XeCl excimer laser systems was demonstrated. The laser systems were evaluated to determine their respective feasibility of improving the damage thresholds of the harmonic materials for use on the National Ignition Facility (NIF). Crystals were first evaluated using an Nd:YAG laser (355 nm, 7.6 ns) by scanning 2 x 2 cm² areas with sub-damage threshold fluences and then performing unconditioned (S/1) damage tests at 355-nm in the respectively scanned regions. Subsequently, five KDP and DKDP samples of various damage quality were raster scanned in a similar fashion at MicroLas GmbH (Goettingen, Germany) using a commercial Lambda Physik Excimer system (XeCl, (lambda) equals 308 nm, 20 ns). The samples treated in Germany were then tested at Livermore National Laboratory (LLNL) at 355 nm to demonstrate the excimer's potential as an alternative conditioning source.

Citation Download Citation

Michael C. Staggs, Ming Yan, and Michael J. Runkel "Laser raster conditioning of KDP and DKDP crystals using XeCl and Nd:YAG lasers", Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); https://doi.org/10.1117/12.425050

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