keV-electron-based table-top soft x-ray source

Bart Buijsse

doi:10.1117/12.449865

6 December 2001 keV-electron-based table-top soft x-ray source

Bart Buijsse

Proceedings Volume 4502, Advances in Laboratory-based X-Ray Sources and Optics II; (2001) https://doi.org/10.1117/12.449865
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

A novel soft X-ray source has been developed that generates soft X-rays of 2.36 nm wavelength. The source is based on focusing a 10 keV electron beam on a continuous jet of water, exciting oxygen K_(alpha ) characteristic radiation. A high-resolution spectrum was recorded which shows a background-free peak at 2.36 nm with a FWHM of 0.017 nm. The brightness of this source is limited by the amount of electron energy that can be dissipated inside the water jet, without endangering the stability of the source. We succeeded in focusing 60 (mu) A onto one side of the jet, at which value the brightness is ~5*10⁸ photons/(sec sr micrometers ²). The source is of potential interest for use in tabletop soft X-ray microscopy, because the line radiation falls just within the water window, the wavelength region that is employed in this type of microscopy.

Citation Download Citation

Bart Buijsse "keV-electron-based table-top soft x-ray source", Proc. SPIE 4502, Advances in Laboratory-based X-Ray Sources and Optics II, (6 December 2001); https://doi.org/10.1117/12.449865

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