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The behaviors of optoelectron have a very important effect on the quality of photosensitive material, especially on the formation of image. In this paper, the dielectric spectrum technology is used to measure the behaviors of optoelectron. The curves of the behaviors of optoelectron are obtained. Many properties of the behaviors of the optoelectron are gotten through the detailed analysis of the results of the measurement. The influences of the behaviors of the optoelectron on the formation of image are analyzed primarily. The results obtained in this paper are valuable to the overall comprehension of the photosensitive mechanism of the silver halide materials and the process of the formation of image.
Xiaowei Li,Xiaoyong Hu,Li Han,Lifang Dong, andWei Yu
"Measurement of the behaviors of optoelectron in the photosensitive material by the dielectric spectrum technology", Proc. SPIE 4600, Advances in Microelectronic Device Technology, (15 October 2001); https://doi.org/10.1117/12.444660
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Xiaowei Li, Xiaoyong Hu, Li Han, Lifang Dong, Wei Yu, "Measurement of the behaviors of optoelectron in the photosensitive material by the dielectric spectrum technology," Proc. SPIE 4600, Advances in Microelectronic Device Technology, (15 October 2001); https://doi.org/10.1117/12.444660