An integrating sphere CCD-based measurement method of the OP-LED opto-electronic characteristics

Yongtaek Hong; Jerzy Kanicki

doi:10.1117/12.451885

3 March 2003 An integrating sphere CCD-based measurement method of the OP-LED opto-electronic characteristics

Yongtaek Hong, Jerzy Kanicki

Proceedings Volume 4800, Organic Light-Emitting Materials and Devices VI; (2003) https://doi.org/10.1117/12.451885
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

An integrating sphere CCD-based measurement system has been developed to accurately characterize the opto-electronic performances of organic polymer light-emitting devices (OP-LEDs). Comparing this method with the previously developed lens-coupled method, we have found that the integrating sphere-based measurement method provides more stable and reliable optical data in comparison with the lens-coupled measurement method. In addition, we demonstrate that an inappropriate calibration of the OP-LED measurement system can greatly exaggerate the device performances.

Citation Download Citation

Yongtaek Hong and Jerzy Kanicki "An integrating sphere CCD-based measurement method of the OP-LED opto-electronic characteristics", Proc. SPIE 4800, Organic Light-Emitting Materials and Devices VI, (3 March 2003); https://doi.org/10.1117/12.451885

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available