Paper
17 October 2003 Porous nanostructured layers on germanium produced by laser optical breakdown processing
Andrei V. Kabashin, Vincent-Gabriel Pilon Marien, D.-Q. Yang, F. Magny, Michel Meunier
Author Affiliations +
Abstract
Germanium wafer surface is modified by a technique of CO2-laser induced air breakdown processing, which was recently introduced and used to produce photoluminescent Si-based nanostructured layers. Structural and optical properties of the Ge-based layers, formed under the irradiation spot as a result of the processing, are characterized by different techniques (SEM, XPS, FTIR, XRD, and PL). It has been found that the layers present a porous structure, containing nanoscale holes, and consist of Ge nanocrystals embedded into GeO2 matrices. They exhibited strong photoluminescence (PL) in the green range (2.2 eV), which was attributed to defects in GeO2 matrix due to the presence of Ge-O modes with some OH vibration in the FTIR spectra. The layers are of importance for local patterning of nanostructures on semiconductors.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrei V. Kabashin, Vincent-Gabriel Pilon Marien, D.-Q. Yang, F. Magny, and Michel Meunier "Porous nanostructured layers on germanium produced by laser optical breakdown processing", Proc. SPIE 4977, Photon Processing in Microelectronics and Photonics II, (17 October 2003); https://doi.org/10.1117/12.478574
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Germanium

Silicon

Semiconducting wafers

Nanostructuring

FT-IR spectroscopy

Laser optics

Semiconductors

Back to Top