Paper
10 October 2003 Computer simulation of the creation of 31P-doped layer in 28Si/30Si/28Si heterostructure by neutron transmutation doping
Yuri V. Trushin, Gennadi V. Mikhailov, Evgeni E. Zhurkin, Vladimir S. Kharlamov, Alexander A. Schmidt, Fedor A. Krusenstern
Author Affiliations +
Proceedings Volume 5127, Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2003) https://doi.org/10.1117/12.517949
Event: Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 2002, St. Petersburg, Russian Federation
Abstract
Recently various physical phenomena involving nuclear spins in semiconductors attract much attention. The problem is to produce an array of impurity atoms with nuclear spin I=1/2 in the atom matrix wiht I=0, i.e. to produce a nuclear-spin engineered semiconductor heterostructure. Both the concentration and the spatial distribution of impurity should be controlled. It is supposed that utilization of 31P atoms as an impurity in 28Si or 30Si matrix possesses significant advantages. Such a structure could be produced by neutron transmutation doping (NTD) of 28Si/30Si/28Si isotopic heterostructure, according to the nuclear reaction 30Si+n→31Si(2.6 hour)→31P. Computer simulation of the NTD process provides the conditions necessary to create 28Si/30Si:31P/28Si heterostructure with good crystal structure and well-defined distribution of impurity concentration. Simulation was carried out using parallel computing capabilities of workstation cluster of AF Ioffe Physico-Technical Institute of the Russian Academy.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuri V. Trushin, Gennadi V. Mikhailov, Evgeni E. Zhurkin, Vladimir S. Kharlamov, Alexander A. Schmidt, and Fedor A. Krusenstern "Computer simulation of the creation of 31P-doped layer in 28Si/30Si/28Si heterostructure by neutron transmutation doping", Proc. SPIE 5127, Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (10 October 2003); https://doi.org/10.1117/12.517949
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KEYWORDS
Chemical species

Computer simulations

Monte Carlo methods

Doping

Heterojunctions

Silicon

Ions

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