Paper
23 December 2003 High selective x-ray multilayers
Vladimir V. Martynov, Yuriy Platonov, Alexander Kazimirov, Donald H. Bilderback
Author Affiliations +
Abstract
Two approaches have been explored to cover existing gap in energy resolution between traditional multilayers (1 to 2%) and perfect crystals (0.01%). The first approach is based on low contrast (Al2O3/B4C) multilayers where we measured the width of the reflectivity curve as low as 17 arc sec, a spectral resolution of 0.27% and a reflectivity of 40% from a 26 Å d-spacing multilayer with 800 bi-layers. The second approach is based on using structures with small d-spacing using traditional W/B4C and Mo/B4C materials. A W/B4C multilayer with 14.8Å d-spacing showed a resolution of 0.5% and a reflectivity of 58.5%. Two Mo/B4C samples with d-spacings of 15Å and 20Å showed energy resolutions of 0.25% and 0.52% with corresponding reflectivities of 39% and 66% correspondingly.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir V. Martynov, Yuriy Platonov, Alexander Kazimirov, and Donald H. Bilderback "High selective x-ray multilayers", Proc. SPIE 5195, Crystals, Multilayers, and Other Synchrotron Optics, (23 December 2003); https://doi.org/10.1117/12.502709
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Cited by 2 scholarly publications.
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KEYWORDS
Multilayers

Reflectivity

Spectral resolution

Aluminum

X-rays

Crystals

Ions

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