Paper
13 November 2003 Parameter estimation of locally stationary wavelet processes
Arthur Johnson III, Ching-Chung Li
Author Affiliations +
Abstract
This paper considers the extraction of information from a locally stationary process modelled by wavelet packets. A method is presented to select subprocesses that characterize the key aspects of the nonstationary process for pattern analysis. The estimated parameters of the selected subprocesses are used to infer the process' time varying behavior. The estimated parameters can be used as features in the attempt to distinguish changing states within a process or differentiate two different locally stationary processes.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Arthur Johnson III and Ching-Chung Li "Parameter estimation of locally stationary wavelet processes", Proc. SPIE 5207, Wavelets: Applications in Signal and Image Processing X, (13 November 2003); https://doi.org/10.1117/12.505549
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KEYWORDS
Wavelets

Statistical analysis

Process modeling

Resistance

Metals

Data modeling

Prototyping

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