Paper
2 April 2004 Comprehensive analysis of InGaP/GaAs heterojunction bipolar transistors (HBTs) with different thickness of setback layers
Shiou-Ying Cheng, Chun-Yuan Chen, Jing-Yuh Chen, Hung-Ming Chuang, Wen-Chau Liu, Wen-Lung Chang, Hsi-Jen Pan, Pao-Chuan Chen
Author Affiliations +
Abstract
We specifically studied the influence of a setback-layer thickness on the device performances so as to optimize the required value. Theoretical analysis shows that an optimized setback-layer thickness is available to effectively reduce the barrier height while maintain good device performances. In this work, the effects of a setback-layer thickness on the DC and RF performances of an InGaP/GaAs heterojunction bipolar transistor (HBT) are investigated. Based on the theoretical analysis, the optimized setback-layer thickness WSB is about of 10~30Å for analog amplification. On the other hand, for digital saturated logic application, i.e., a small offset voltage with an acceptable current gain, the optimized WSB could be up to 50 Å. Therefore, this analysis and predication may cause the considerable promise for practical circuit applications.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shiou-Ying Cheng, Chun-Yuan Chen, Jing-Yuh Chen, Hung-Ming Chuang, Wen-Chau Liu, Wen-Lung Chang, Hsi-Jen Pan, and Pao-Chuan Chen "Comprehensive analysis of InGaP/GaAs heterojunction bipolar transistors (HBTs) with different thickness of setback layers", Proc. SPIE 5276, Device and Process Technologies for MEMS, Microelectronics, and Photonics III, (2 April 2004); https://doi.org/10.1117/12.522286
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KEYWORDS
Heterojunctions

Transistors

Analog electronics

Logic

Digital electronics

Electrical engineering

Gallium

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