Paper
12 May 2004 Test of 1.06-μm photo detector of PIN photodiode
Author Affiliations +
Proceedings Volume 5280, Materials, Active Devices, and Optical Amplifiers; (2004) https://doi.org/10.1117/12.520369
Event: Asia-Pacific Optical and Wireless Communications, 2003, Wuhan, China
Abstract
The paper introduces the principle and structure of the PIN diode detector, and then describes the researching background and the responding characteristic of the detector. The high responsibility of photodiode response characteristic is important. The paper designs a set of testing device to measure the responsibility. The optical part can produce a laser pulse of 1.06μm with a certain frequency and energy, with the aid of white light source and CCD camera, the laser beam can focus on the surface of the photon detector of PIN diode. The signal-testing instruments can measure the responding characteristic of the photon detector, and the average noise power. The paper gives the waveforms of the laser pulse and the responding signals.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
RonGuo Fu, BenKang Chang, YunSheng Qian, ZhiYuan Zong, and Yafeng Qiu "Test of 1.06-μm photo detector of PIN photodiode", Proc. SPIE 5280, Materials, Active Devices, and Optical Amplifiers, (12 May 2004); https://doi.org/10.1117/12.520369
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KEYWORDS
PIN photodiodes

Sensors

Integrated circuits

Pulsed laser operation

Signal detection

Resistance

Photodetectors

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