Evaluation of a portable FTIR for in-situ field measurements of surface reflectance

Rob K. Newsom; Robert D. Kaiser; August O. Schutte

doi:10.1117/12.560501

2 August 2004 Evaluation of a portable FTIR for in-situ field measurements of surface reflectance

Rob K. Newsom, Robert D. Kaiser, August O. Schutte

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Proceedings Volume 5532, Interferometry XII: Applications; (2004) https://doi.org/10.1117/12.560501
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

Development of target detection algorithms and simulation models for present and future multispectral and hyperspectral sensor systems requires accurate characterization of the reflectance and thermal emission of natural and man-made materials. Fourier transform spectrometry is one method for obtaining relatively high spectral resolution, in-situ measurements of surface reflectance. This paper discusses the performance characteristics of the SOC-400T FTIR and its application to field measurements. The SOC-400T is a relatively small and portable FTIR reflectometer that was designed to measure the directional reflectance and calculate the directional thermal emittance of surfaces in the spectral range from 2 to 25 ημm. The SOC-400T uses a silicone carbide glowbar to illuminate samples. This permits accurate results to be obtained in the MWIR. We recently deployed this instrument to the field to perform measurements on various materials of interest to the military. Prior to the deployment, the instrument was evaluated to assess its performance under true field operating conditions. This paper specifically examines noise characteristics, warmup time, transients induced by reorientation of the sensor, spurious detector artifacts, and sensitivity to vibration. We also address the practical issue associated with positioning, stabilizing, and calibrating the instrument for field measurements of irregular or arbitrarily oriented surfaces.

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Rob K. Newsom, Robert D. Kaiser, and August O. Schutte "Evaluation of a portable FTIR for in-situ field measurements of surface reflectance", Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); https://doi.org/10.1117/12.560501

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KEYWORDS

Reflectivity

Sensors

Calibration

System on a chip

Gold

Signal to noise ratio

Apodization

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