Wide-range two-dimensional small rotation-angle measurement by use of fringe projection

Takamasa Suzuki; Takanori Endo; John E. Greivenkamp; Osami Sasaki

doi:10.1117/12.580662

20 January 2005 Wide-range two-dimensional small rotation-angle measurement by use of fringe projection

Takamasa Suzuki, Takanori Endo, John E. Greivenkamp, Osami Sasaki

Proceedings Volume 5633, Advanced Materials and Devices for Sensing and Imaging II; (2005) https://doi.org/10.1117/12.580662
Event: Photonics Asia, 2004, Beijing, China

Abstract

A system for two-dimensional small rotation-angle measurement is proposed and demonstrated. Because the measurement is not conducted by the interference but the fringe projection, it is basically robust for the external disturbance. While the setup is very simple, there is no requirement on the size of the object. We also proposed two-dimensional two-grating method and a unit that miniaturizes the system. Several measurements confirm us that the measurement accuracy of our proposed system is ~0.4 arcsec.

Citation Download Citation

Takamasa Suzuki, Takanori Endo, John E. Greivenkamp, and Osami Sasaki "Wide-range two-dimensional small rotation-angle measurement by use of fringe projection", Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); https://doi.org/10.1117/12.580662

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