Paper
23 March 2005 Measurement of spatial-frequency and amplitude characteristics of a device for laser beam quality characterization
Alexander N. Starodub, Vyacheslav P. Kirillov, Andrey V. Kutsenko, Yury A. Mikhailov, Gleb V. Sklizkov, Oleg A. Sudakov, Kirill A. Zhurovich
Author Affiliations +
Proceedings Volume 5777, XV International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers; (2005) https://doi.org/10.1117/12.611253
Event: XV International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers, 2004, Prague, Czech Republic
Abstract
A unique method has been developed for studying spatial-frequency and amplitude characteristics of an image registration device on the basis of a CCD-matrix. A monochromatic light intensity distribution arising from Fraunhofer diffraction on two equal slits is used as an input signal.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander N. Starodub, Vyacheslav P. Kirillov, Andrey V. Kutsenko, Yury A. Mikhailov, Gleb V. Sklizkov, Oleg A. Sudakov, and Kirill A. Zhurovich "Measurement of spatial-frequency and amplitude characteristics of a device for laser beam quality characterization", Proc. SPIE 5777, XV International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers, (23 March 2005); https://doi.org/10.1117/12.611253
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KEYWORDS
Charge-coupled devices

Image registration

Spatial frequencies

Diffraction

Interferometers

Far-field diffraction

Photography

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