Paper
6 December 2006 Energy dispersive x-ray fluorescence analyzer with several x-ray tubes
G. I. Borisov, R. I. Kondratenko, V. A. Mikhin, B. V. Odinov, A. V. Pukhov
Author Affiliations +
Proceedings Volume 5943, X-ray and Neutron Capillary Optics II; 59431A (2006) https://doi.org/10.1117/12.638014
Event: X-ray and Neutron Capillary Optics II, 2004, Zvenigorod, Russian Federation
Abstract
X-ray flurescent analyzer (XFA) has been developed and fabricated for determining sulphur, vanadium and nickel in oil. The instrument is equipped with three x-ray tubes with transmission Ti, Cu and Ag anodes, and aluminum, copper, and germanium filters, respectively, and one common switchable power supply. To excite characteristic radiation of determined elements, the characteristic radiation of the tube anode (titan, copper) is used, or the charactersitic radiation of the filter (germanium). XFA is fitted with one small-size electrically cooled semiconductor detector. The measuring device is based on a wide-angle geometry of characteristic radiation excitation and registration, where the x-ray tube focus illuminates the sample, and the registering detector 'sees' the illuminated area within the plane angle of 90° (it corresponds to 0.146 of 4p). Under such geometry, the dependence of the count rate for excited characteristic photons on the position of sample under study has a smooth maximum in the calculated sample position point. For one, the rate count changes by less than 1%. Quantitative results are obtained through the regression method. The instrument underwent metrology testing. It is designed for operation both in the laboratory and industrial environment. The instrument has been delivered for operation to the "Druzhba" pipeline.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. I. Borisov, R. I. Kondratenko, V. A. Mikhin, B. V. Odinov, and A. V. Pukhov "Energy dispersive x-ray fluorescence analyzer with several x-ray tubes", Proc. SPIE 5943, X-ray and Neutron Capillary Optics II, 59431A (6 December 2006); https://doi.org/10.1117/12.638014
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KEYWORDS
X-rays

Vanadium

Error analysis

Copper

Nickel

Silver

Statistical analysis

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