Intensive x-ray source optimization

G. Bochek; N. Maslov; V. Ovchinnik

doi:10.1117/12.639987

7 December 2006 Intensive X-ray source optimization

G. Bochek, N. Maslov, V. Ovchinnik

Proceedings Volume 5974, International Conference on Charged and Neutral Particles Channeling Phenomena; 59740F (2006) https://doi.org/10.1117/12.639987
Event: International Conference on Charged and Neutral Particles Channeling Phenomena, 2004, Rome, Italy

Abstract

Optimization possibility of an intensive radiation source by electrons in crystals was considered. The technique is based on the Compton scattering of X-radiation. To obtain the initial "true" radiation spectrum, it is necessary to restore the spectrum of the measured scattered radiation by means of the inverse Compton transform.

Citation Download Citation

G. Bochek, N. Maslov, and V. Ovchinnik "Intensive X-ray source optimization", Proc. SPIE 5974, International Conference on Charged and Neutral Particles Channeling Phenomena, 59740F (7 December 2006); https://doi.org/10.1117/12.639987

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