Reliability engineering: basics and applications for optoelectronic components and systems

Marcel Held; Rolf Brönnimann; Philipp M. Nellen; Ling Zhou

doi:10.1117/12.671878

28 April 2006 Reliability engineering: basics and applications for opto-electronic components and systems

Marcel Held, Rolf Brönnimann, Philipp M. Nellen, Ling Zhou

Proceedings Volume 6188, Optical Micro- and Nanometrology in Microsystems Technology; 618815 (2006) https://doi.org/10.1117/12.671878
Event: SPIE Photonics Europe, 2006, Strasbourg, France

Abstract

The foundation pillars of successful technical products are performance, cost, and reliability. The development of reliable components and the operation of highly available systems is a comprehensive engineering task combining probability theory, materials science, and experience. Components have to be as reliable as necessary in order to build systems that are dependable and cost efficient during the whole life cycle. Reliability engineering is an ongoing process starting at the conceptual phase of a product design and continuing throughout all phases of a product life cycle. Theprimary objective is to identify and eliminate potential reliability problems as early as possible. While it may never be too late to improve the reliability of a product, corrections are orders of magnitude less expensive in the early design phase rather than once the product is manufactured and in service. This paper comprises an introduction to basic reliability engineering terms, reliability analysis methods such as reliability block diagrams, failure mode and effects analysis, Markov processes, the concept of redundancy, failure rate prediction models and the physics of failure approach, qualification and accelerated reliability testing. Examples of electronic and optical components, as well as complex opto-electronic systems and networks are given for illustration.

Citation Download Citation

Marcel Held, Rolf Brönnimann, Philipp M. Nellen, and Ling Zhou "Reliability engineering: basics and applications for opto-electronic components and systems", Proc. SPIE 6188, Optical Micro- and Nanometrology in Microsystems Technology, 618815 (28 April 2006); https://doi.org/10.1117/12.671878

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