Paper
12 June 2007 Continuous-wave operation of photonic band-edge laser at 1.55 μm on silicon wafer
G. Vecchi, F. Raineri, I. Sagnes, A. M. Yacomotti, P. Monnier, R. Braive, S. Bouchoule, A. Levenson, R. Raj
Author Affiliations +
Proceedings Volume 6593, Photonic Materials, Devices, and Applications II; 659322 (2007) https://doi.org/10.1117/12.724170
Event: Microtechnologies for the New Millennium, 2007, Maspalomas, Gran Canaria, Spain
Abstract
We present continuous-wave laser operation at room temperature at 1.55 μm by optically pumping a photonic crystal structure containing an InGaAs/InP quantum well active layer. The active layer is integrated onto a Silicon chip by means of Au/In bonding technology. This metallic layer provides the reduction of heating by thermal dissipation into the substrate, and increases the quality-factor by reducing the radiative losses.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Vecchi, F. Raineri, I. Sagnes, A. M. Yacomotti, P. Monnier, R. Braive, S. Bouchoule, A. Levenson, and R. Raj "Continuous-wave operation of photonic band-edge laser at 1.55 μm on silicon wafer", Proc. SPIE 6593, Photonic Materials, Devices, and Applications II, 659322 (12 June 2007); https://doi.org/10.1117/12.724170
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Cited by 3 scholarly publications.
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KEYWORDS
Continuous wave operation

Reflectivity

Silicon

Semiconductor lasers

Photonic crystals

Modulation

Pulsed laser operation

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