Paper
14 November 2007 Inclusion initiated damage studies at repetition rate pulse laser
Fu Dai, Sheng-ming Xiong, Yun-dong Zhang
Author Affiliations +
Proceedings Volume 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 67221S (2007) https://doi.org/10.1117/12.783023
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
Theory of laser-induced damage to dielectric films wich contain highly absorbing impurities was proposed previously for single-shot damage of multiple shots. By the model of damage induced by inclusions in dielectric thin-films, with the experiment done by S.Papernov et al who deposited HfO2 thin-films containing gold nanoparticles on a cleaved fused-silica by e-beam evaporation, the absorption cross-section of gold was obtained. Furthermore, the Laser-induced damage threshold induced by inclusions with varies radius and varies repetition frequency was calculated.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fu Dai, Sheng-ming Xiong, and Yun-dong Zhang "Inclusion initiated damage studies at repetition rate pulse laser", Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67221S (14 November 2007); https://doi.org/10.1117/12.783023
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KEYWORDS
Gold

Absorption

Laser damage threshold

Laser induced damage

Particles

Thin films

Hybrid fiber optics

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