Fabrication and characterization of large area mercuric iodide polycrystalline films

Jianbao Gui; Jinchuan Guo; Qinlao Yang; Xufang Liu; Hanben Niu

doi:10.1117/12.755851

29 November 2007 Fabrication and characterization of large area mercuric iodide polycrystalline films

Jianbao Gui, Jinchuan Guo, Qinlao Yang, Xufang Liu, Hanben Niu

Proceedings Volume 6833, Electronic Imaging and Multimedia Technology V; 68332H (2007) https://doi.org/10.1117/12.755851
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

Mercuric iodide (HgI₂) polycrystalline films are being developed as a new photoconductor layer for direct converter X-ray imaging detector. A physical vapor deposition (PVD) device for HgI₂ deposition was developed specially. Depending on the device and low purity (99.5%) low-cost HgI₂ source material, polycrystalline HgI₂ films have been grown with dimensions Φ130 mm in diameter onto ITO-coated glass substrate. The grown techniques used can be easily extended to produce much larger films areas and the thickness of the grown layers, size of the grains and crystallinity can be regulated in a controlled way by adjusting the growth parameters. The basic physical characteristic, dark current and response characteristic to X-ray for the grown polycrystalline film were tested and the results show that the film has preferred crystalline orientation (00l), low dark current density less than 10 pA/mm², high volume resistivity in the order of 10¹³ Ω•cm and high X-ray response sensitivity of about 16 μC/(cm²•R), and the results put HgI₂ polycrystalline films in position as a leading candidate material for use in digital X-ray imaging system.

Citation Download Citation

Jianbao Gui, Jinchuan Guo, Qinlao Yang, Xufang Liu, and Hanben Niu "Fabrication and characterization of large area mercuric iodide polycrystalline films", Proc. SPIE 6833, Electronic Imaging and Multimedia Technology V, 68332H (29 November 2007); https://doi.org/10.1117/12.755851

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