Gaussian beam mode analysis of phase gratings

Robert May; J. Anthony Murphy; Creidhe O'Sullivan; Marcin Gradziel; Neil Trappe

doi:10.1117/12.763624

14 February 2008 Gaussian beam mode analysis of phase gratings

Robert May, J. Anthony Murphy, Creidhe O'Sullivan, Marcin Gradziel, Neil Trappe

Proceedings Volume 6893, Terahertz Technology and Applications; 68930G (2008) https://doi.org/10.1117/12.763624
Event: Integrated Optoelectronic Devices 2008, 2008, San Jose, California, United States

Abstract

Gaussian Beam Mode Analysis can be applied as a powerful technique approach in the development of phase gratings for use at terahertz wavelengths, providing a physically intuitive approach relating Fourier and Fresnel diffraction patterns to the scattering of the illumination beam at the grating. Fourier gratings in particular offer the possibility of generating sparse arrays image of a single input beam, useful, for example, in active heterodyne systems with an LO power source. The feasibility of the application of such gratings in real systems was investigated both by simulation and experimental measurements.

Citation Download Citation

Robert May, J. Anthony Murphy, Creidhe O'Sullivan, Marcin Gradziel, and Neil Trappe "Gaussian beam mode analysis of phase gratings", Proc. SPIE 6893, Terahertz Technology and Applications, 68930G (14 February 2008); https://doi.org/10.1117/12.763624

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