Image reconstruction in electron microscopy

Yili Zheng; Seunghee Lee; Peter C. Doerschuk

doi:10.1117/12.801717

5 September 2008 Image reconstruction in electron microscopy

Yili Zheng, Seunghee Lee, Peter C. Doerschuk

Proceedings Volume 7076, Image Reconstruction from Incomplete Data V; 70760G (2008) https://doi.org/10.1117/12.801717
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

Maximum likelihood statistical algorithms are described for estimating the 3-D variation of the electron scattering intensity of biological objects from cryo electron microscopy images of multiple instances of the object. Three virus objects, two spherical and one helical, are considered. Solution of the maximum likelihood problem by expectation maximization algorithms or by direct maximization of the log likelihood requires large scale computing and end-to-end codesign of biological problem formulation, statistical models, algorithms, and software design and implementation have contributed to achieving practical results.

Citation Download Citation

Yili Zheng, Seunghee Lee, and Peter C. Doerschuk "Image reconstruction in electron microscopy", Proc. SPIE 7076, Image Reconstruction from Incomplete Data V, 70760G (5 September 2008); https://doi.org/10.1117/12.801717

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