A new behavioral modeling approach for digital I/O ports

Jian-guo Shen; Min-lan Jiang; Qinggen Zheng; Yushun Guo

doi:10.1117/12.806442

13 October 2008 A new behavioral modeling approach for digital I/O ports

Jian-guo Shen, Min-lan Jiang, Qinggen Zheng, Yushun Guo

Proceedings Volume 7127, Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence; 71271P (2008) https://doi.org/10.1117/12.806442
Event: Seventh International Symposium on Instrumentation and Control Technology, 2008, Beijing, China

Abstract

This paper addresses a new and efficient behavioral modeling method of digital I/O ports for EMC and signal integrity simulations. The proposed modeling methodology is based on the fuzzy logic system from port voltage and current transient waveforms. The obtained models can be implemented as SPICE subcircuit conveniently and their accuracy and efficiency are verified by applying to the approach to the characterization of transistor -level models of actual devices.

Citation Download Citation

Jian-guo Shen, Min-lan Jiang, Qinggen Zheng, and Yushun Guo "A new behavioral modeling approach for digital I/O ports", Proc. SPIE 7127, Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence, 71271P (13 October 2008); https://doi.org/10.1117/12.806442

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