Paper
7 January 2009 Nanopolishing: parameters and techniques
Aurelian Ovidius I. Trufasu, Virginia Maduta, Cristina Liliana Trufasu
Author Affiliations +
Proceedings Volume 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV; 72971L (2009) https://doi.org/10.1117/12.823667
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 2008, Constanta, Romania
Abstract
The thermal regime had to meet two needs: to be big enough for a fast polishing and small enough not to influence the support or piece. The dilatation coefficient is different for pieces and support make a modification of outside topography which influence the final shape of surface, consequently ΔN. The present study propose to establish a link between temperature uniformity in the same time on piece or polishing device surface, respectively, final quality of topography polished surface.
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Aurelian Ovidius I. Trufasu, Virginia Maduta, and Cristina Liliana Trufasu "Nanopolishing: parameters and techniques", Proc. SPIE 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 72971L (7 January 2009); https://doi.org/10.1117/12.823667
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KEYWORDS
Polishing

Surface finishing

Particles

Liquids

Infrared cameras

Lenses

Temperature metrology

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