Paper
26 February 2010 Experimental scheme for observation of anomalous Kossel effect in semiconductor crystals
Pavel G Medvedev, Mikhail A. Chuev, Mikhail V. Kovalchuk, Elhan M. Pashaev, Ilia A. Subbotin, Sergey N. Yakunin
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Proceedings Volume 7521, International Conference on Micro- and Nano-Electronics 2009; 752115 (2010) https://doi.org/10.1117/12.854221
Event: International Conference on Micro- and Nano-Electronics 2009, 2009, Zvenigorod, Russian Federation
Abstract
A theoretical analysis of the experimental scheme geometry for the anomalous Kossel effect observation is performed. Fluorescence radiation from germanium is induced by characteristic MoKα radiation incident on the crystal at a small angle close to the specular reflection angle. First experimental results on observation of anomalous Kossel lines from the germanium crystal are presented.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pavel G Medvedev, Mikhail A. Chuev, Mikhail V. Kovalchuk, Elhan M. Pashaev, Ilia A. Subbotin, and Sergey N. Yakunin "Experimental scheme for observation of anomalous Kossel effect in semiconductor crystals", Proc. SPIE 7521, International Conference on Micro- and Nano-Electronics 2009, 752115 (26 February 2010); https://doi.org/10.1117/12.854221
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KEYWORDS
Crystals

X-rays

Chemical species

Reflection

Diffraction

Laser crystals

Germanium

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