Standoff detection of explosives: a challenging approach for optical technologies

S. Désilets; N. Hô; P. Mathieu; J. R. Simard; E. Puckrin; J. M. Thériault; H. Lavoie; F. Théberge; F. Babin; D. Gay; R. Forest; J. Maheux; G. Roy; M. Châteauneuf

doi:10.1117/12.885616

13 May 2011 Standoff detection of explosives: a challenging approach for optical technologies

S. Désilets, N. Hô, P. Mathieu, J. R. Simard, E. Puckrin, J. M. Thériault, H. Lavoie, F. Théberge, F. Babin, D. Gay, R. Forest, J. Maheux, G. Roy, M. Châteauneuf

Author Affiliations +

Proceedings Volume 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III; 80312C (2011) https://doi.org/10.1117/12.885616
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

Standoff detection of explosives residues on surfaces at few meters was made using optical technologies based on Raman scattering, Laser-Induced Breakdown Spectroscopy (LIBS) and passive standoff FTIR radiometry. By comparison, detection and analysis of nanogram samples of different explosives was made with a microscope system where Raman scattering from a micron-size single point illuminated crystal of explosive was observed. Results from standoff detection experiments using a telescope were compared to experiments using a microscope to find out important parameters leading to the detection. While detection and spectral identification of the micron-size explosive particles was possible with a microscope, standoff detection of these particles was very challenging due to undesired light reflected and produced by the background surface or light coming from other contaminants. Results illustrated the challenging approach of detecting at a standoff distance the presence of low amount of micron or submicron explosive particles.

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S. Désilets, N. Hô, P. Mathieu, J. R. Simard, E. Puckrin, J. M. Thériault, H. Lavoie, F. Théberge, F. Babin, D. Gay, R. Forest, J. Maheux, G. Roy, and M. Châteauneuf "Standoff detection of explosives: a challenging approach for optical technologies", Proc. SPIE 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III, 80312C (13 May 2011); https://doi.org/10.1117/12.885616

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