Dependence of detection limits on angular alignment, substrate type and surface concentration in active mode standoff IR

Carlos A. Ortega-Zuñiga; Nataly Y. Galán-Freyle; John R. Castro-Suarez; Joaquín Aparicio-Bolaño; Leonardo C. Pacheco-Londoño; Samuel P. Hernández-Rivera

doi:10.1117/12.2016196

23 May 2013 Dependence of detection limits on angular alignment, substrate type and surface concentration in active mode standoff IR

Carlos A. Ortega-Zuñiga, Nataly Y. Galán-Freyle, John R. Castro-Suarez, Joaquín Aparicio-Bolaño, Leonardo C. Pacheco-Londoño, Samuel P. Hernández-Rivera

Author Affiliations +

Proceedings Volume 8734, Active and Passive Signatures IV; 87340R (2013) https://doi.org/10.1117/12.2016196
Event: SPIE Defense, Security, and Sensing, 2013, Baltimore, Maryland, United States

Abstract

A standoff multivariate calibration for detection of highly energetic materials (HEM) using Fourier transform infrared spectroscopy is presented in this report. The procedure consists in standoff sensing at 1 m distance and the variation of three parameters of detection. The first variable considered was the angular dependence: 0° to 45‡ from source-target with respect to alignment of target-detector. The second variable consisted on the use of several surfaces on which the material was deposited. The substrates used were polished aluminum and anodized aluminum. The third variable studied was the dependence on some specific analyte loading surface concentration: from 10 μg/cm² to200 μg/cm². The HEM used in this work was PETN, synthesized in our lab. Calibration curves were based on the use of chemometrics routines such as partial least squares (PLS) regression analysis. This algorithm was used to evaluate the impact of the angular dependence about the limits of detection of different HME loadings on aluminum substrates.

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Carlos A. Ortega-Zuñiga, Nataly Y. Galán-Freyle, John R. Castro-Suarez, Joaquín Aparicio-Bolaño, Leonardo C. Pacheco-Londoño, and Samuel P. Hernández-Rivera "Dependence of detection limits on angular alignment, substrate type and surface concentration in active mode standoff IR", Proc. SPIE 8734, Active and Passive Signatures IV, 87340R (23 May 2013); https://doi.org/10.1117/12.2016196

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