Full-field displacement measurement by double symmetrical illumination through reflection holograms

V. Sainov; A. Baldjiev; E. Stoykova

doi:10.1117/12.2017990

22 June 2013 Full-field displacement measurement by double symmetrical illumination through reflection holograms

V. Sainov, A. Baldjiev, E. Stoykova

Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87691A (2013) https://doi.org/10.1117/12.2017990
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore

Abstract

Compact and stable phase stepping interferometer for shape and full field displacement measurement in static and in “real time” operation mode is presented. Double symmetrical illumination of the object in two orthogonal planes with diode lasers, emitting in NIR (790 nm and 830 nm), through a four-exposure reflective holographic optical element (Denisiyk’s volume reflection holograms of a reference plane) is applied. Phase stepping is introduced simply by precise increments of the diode lasers current. The proposed system is very stable against external noise, produced by vibrations, temperature changes, air flows, as well as against the influence of object’s “rigid body” motion, as the compact and low weight interferometer can be stably fixed directly onto the measured construction.

Citation Download Citation

V. Sainov, A. Baldjiev, and E. Stoykova "Full-field displacement measurement by double symmetrical illumination through reflection holograms", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87691A (22 June 2013); https://doi.org/10.1117/12.2017990

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