Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser

T. Koyama; H. Yumoto; K. Tono; T. Sato; T. Togashi; Y. Inubushi; T. Katayama; J. Kim; S. Matsuyama; H. Mimura; M. Yabashi; K. Yamauchi; H. Ohashi

doi:10.1117/12.2025377

27 September 2013 Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser

T. Koyama, H. Yumoto, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi

Author Affiliations +

Proceedings Volume 8848, Advances in X-Ray/EUV Optics and Components VIII; 88480T (2013) https://doi.org/10.1117/12.2025377
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

X-ray free electron lasers (XFELs) with intense and ultra-short pulse X-rays possibly induce damage to optical elements. We investigated the damage thresholds of optical materials by using focusing XFEL beams with sufficient power density for studying ablation phenomena. 1-μm focusing beams with 10 keV photon energy were produced at the XFEL facility SACLA (SPring-8 Angstrom Compact free electron LAser). The focusing beams irradiated samples of rhodium-coated substrate, which is used in X-ray mirror optics, under grazing incident condition.

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T. Koyama, H. Yumoto, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, and H. Ohashi "Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser", Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480T (27 September 2013); https://doi.org/10.1117/12.2025377

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